报告人：Chun Jason Xue，香港城市大学计算机科学系副教授

报告时间：2020年12月4日 下午3：30

报告地点：Zoom在线会议

https://us02web.zoom.us/j/2810019605?pwd=S09LNnl5dHdXajZBbEJJOVd4TVlmUT09

Meeting ID: 281 001 9605

Passcode: HNU2020

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报告摘要：Mobile devices, such as smartphones, have become a necessity in our daily life. NAND flash memory is the primary choice of data storage for mobile devices due to its high performance, shock resistance and low power consumption. To provide large-capacity storage systems, the latest flash memories are worse in terms of I/O performance and less durable in terms of reliability. System designers face a design issue on how to fast access and reliably operate mobile flash storage throughout the entire life cycle of a smartphone. The issue becomes even more challenging because the average replacement cycle of smartphones is forecast to be greatly extended. This talk will first introduce comprehensive studies of the flash device characteristics and mobile data access patterns. Based on that, we propose several approaches to improve the I/O access performance and extend the lifetime of mobile flash storage.

报告人简介：Dr. Chun Jason Xue is an Associate Professor at City University of Hong Kong Computer Science Department. His research interests include non-volatile memories, embedded and mobile systems. He is currently Associate Editor for ACM Transaction on Embedded Computing Systems. He was the TPC co-chair for LCTES 2015, TPC co-chair for ISVLSI 2016, and has served as TPC members in premiere conferences such as DAC, DATE, RTSS, RTAS, CODES, EMSOFT and ISLPED.

邀请人：李肯立

联系人：陈建国